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Scanning Transmission Electron Microscope TEM/STEM TitanTM G2 60-300 with imaging Cs-corrector is an advanced tool for structural characterization of materials at sub-Angstrom resolution Stock Image

Scanning Transmission Electron Microscope TEM/STEM TitanTM G2 60-300 with imaging Cs-corrector is an advanced tool for structural characterization of materials at sub-Angstrom resolution
b20-1901962 | age fotostock | Rights Managed
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