Scanning Transmission Electron Microscope TEM/STEM TitanTM G2 60-300 with imaging Cs-corrector is an advanced tool for structural characterization of materials at sub-Angstrom resolution Stock Image

Stock Image - Scanning Transmission Electron Microscope TEM/STEM TitanTM G2 60-300 with imaging Cs-corrector is an advanced tool for structural characterization of materials at sub-Angstrom resolution. Fotosearch

Scanning Transmission Electron Microscope TEM/STEM TitanTM G2 60-300 with imaging Cs-corrector is an advanced tool for structural characterization of materials at sub-Angstrom resolution

b20-1901961 | age fotostock | Rights Managed

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