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Replacing the sample holder, FIB Control Pannel, Focused-Ion-Beam Nanofabrication Laboratory, Dual-Beam Focused-Ion-Beam FIB, Helios NanoLabTM DualBeamTM, Nanofabrication Tool, Nano-scale materials fabrication and manipulation Stock Image
Replacing the sample holder, FIB Control Pannel, Focused-Ion-Beam Nanofabrication Laboratory, Dual-Beam Focused-Ion-Beam FIB, Helios NanoLabTM DualBeamTM, Nanofabrication Tool, Nano-scale materials fabrication and manipulation
b20-1459193 | age fotostock | Rights Managed
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adult, basque country, beam, bracket, center, cic, color image, control, cooperative, device, donostia, dual, equipment, fabrication, female, female only, fib, focused ion beam, gear, glove, guipuzcoa, helios, high-resolution, holder, indoors, inside, interior, lab coat, laboratory, manipulation, material, materials science, nano, nanogune, nanotechnology, one, one person, one woman only, pannel, people, processing, protection, replace, research, research and development, research centre, researcher, sample, san sebastian, scale, scanning electron microscopy, science, science and technology, spain, structural, support, surface, technology, tool, vertical, woman, woman (only), workstation, stock image, images, royalty free photo, stock photos, stock photograph, stock photographs, picture, pictures, graphic, graphics, fine art prints, print, poster, posters, mural, wall murals, b20-1459193, b20 1459193, b201459193
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